It is used to detect the performance of products under rapid temperature changes and extreme temperature conditions. Mainly used in semiconductor chips, scientific research institutions, quality inspection, new energy, optoelectronic communications, aerospace, automotive industry, LCD display, medical and other science and technology industries.
Meet test criteria
1.GB/T 2423.1 Low temperature test method
2.GJB 150.3 high temperature test
3.GB/T 2423.2 high temperature test method
4.GJB 150.4 low temperature test
5.GB/T2423.22 temperature cycle test method
6. IEC 60068-2 temperature test method
Technical parameters: |
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name |
Rapid temperature change test chamber |
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Model Number |
WBE-KSH-150L |
WBE-KSH-225L |
WBE-KSH-512L |
WBE-KSH-1000L |
WBE-KSH-2400L |
WBE-KSH-3400L |
WBE-KSH-4600L |
Volume(L) |
150 |
225 |
512 |
1000 |
2400 |
3400 |
4600 |
Test room dimensions (WxDxH)(mm) |
500x500x600 |
600x500x750 |
800x800x800 |
1100x900x1100 |
1300x1400x1300 |
1500x1500x1500 |
1800x1500x1700 |
Window (WxH) (mm) |
210x300 |
280x350 |
360x510 |
360x510 |
360x510 |
360x510*2 |
360x510*2 |
Linear temperature range and linear temperature rate /min |
-40~125 ° C (AX linear 2 ° C /5 ° C /10 ° C /15 ° C /20 ° C /25 ° C; AF Nonlinear 2℃/5℃/10℃/15℃/20℃/25℃) |
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AX2、AX5、AX10、AX15、AX20、AX25 , AF2、AF5、AF10、AF15、AF20、AF25; For example, AX15: A linear range -40~125 ° C, X linear 15 ° C. AF15: A nonlinear range: -40~125℃, F nonlinear 15℃, |
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Nonlinear (average) temperature range and nonlinear (average) temperature rate /min |
-55~125℃ (CX linear 2℃/5℃/10℃/15℃; CF nonlinear 2℃/5℃/10℃/15℃/20℃/25℃) |
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CX2、CX5、CX10、CX15,CF2、CF5、CF10、CF15、CF20、CF25; For example, CX10: C linear range -55~125 ° C,X linear range 10 ° C. CF10: C nonlinear range: -55~125 ° C,F nonlinear 10 ° C. |
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Environmental requirement |
Air cooling ambient temperature requirements +5 to +30°C/Water cooling ambient temperature requirements +5 to +40°C (Water cooling requires a water tower or water cooler). |
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Temperature performance index: |
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Temperature range |
-70℃~+150℃ |
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Temperature uniformity |
≤2.0℃。 |
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Temperature deviation |
≤±2.0℃。 |
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Temperature fluctuation |
≤±0.5℃ (≤±0.5℃, according to GB/T5170-1996). |
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Power source |
AC380V±10%,50Hz±1 Three-phase four-wire + ground cable (3/N/PE), grounding resistance less than 4Ω. |
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Standard configuration |
observation window (double hollow tempered conductive glass) 1pcs; Test hole Φ50/Φ100mm (on the left) 1pcs; Sample rack 2 layers 1pcs; camera light (LED light strip) 1pcs in the box; small casters 4pcs; power cable 1pcs. |